Request FOM access
- New users must go to FOM (Facility Online Manager) and complete the "I am a New User" form, please do not include any spaces in your username.
- If you would like to learn more about the use and functions of FOM, please review the User Manual provided.
- The MMCL capabilities can be accessed by use-request via the web-based system FOM at https://fom.nano.pitt.edu/fom/welcome.
Available Resources
Scroll down for details about each instrument.
Optical Microscopy: Keyence VHX 7000N, Keyence VHX 970, Zeiss Smartzoom 5
X-Ray Analysis: Phenom XL G2 SEM, Bruker Skyscan 1272 micro-CT, Rigaku Miniflex XRD
Surface Evaluation: Bruker Contour GT-I optical profilometer, Keyence VR-3200 optical profilometer, Hysitron TI900 Triboindenter
Thermal Property Analysis: Netzsch Laser Flash Analyzer 427, Netzsch Thermomechanical Analyzer 402 F1
Keyence VHX 970 Optical Microscope
The Keyence VHX 970 DOM features a wide range of magnification options at high resolution and short working distance, making it ideal for polished metal samples, or high-mag evaluation without an SEM. Additional lighting and adapter options makes for a flexible and easily customizable imaging experience.
Keyence VHX 7000N Optical Microscope
The KEYENCE VHX 7000N is the World's First 4K Ultra-High accuracy microscope. Combining resolution high enough to support 4K image quality with a large depth of field. Observation can be carried out automatically at magnifications from 20× to 2000x. This is the first model to feature the Focus View function. Advanced image analysis is fully automatic. Elemental Analysis, grain size measurement and high-speed image stitching functions are available.
Zeiss Smartzoom 5 Optical Microscope
The Zeiss Smartzoom 5 digital optical microscope is highly automated and makes imaging simple and repeatable. Two available lenses span the approximate magnification range of 10-1000x.
The Smartzoom microscope is ideal for microscope novices, large samples, high throughput of similar imaging protocols, 3D mapping using focus detection, and objects that require a high depth of field.
Bruker Skyscan 1272 micro-CT
The Bruker Skyscan 1272 employs micro-computed tomography to visualize a 3D object. X-rays are used to form a shadow projection at multiple angular steps, and algorithms are used to reconstruct the object based on the X-ray attenuation in each projection.
Included with the instrument is the 3D.SUITE software, enabling all steps of the analysis process: reconstruction (NRecon), 2D/3D morphological analysis (CTAn), and 3D visualization (CTVox). A second computer is also available for dedicated analysis, to streamline workflow.
Specifications, from the Bruker page on the SkyScan 1272:
| Feature | Specification | Benefit |
| X-ray source |
20 – 100 kV 10 W < 5 µm spot size at 4 W |
Maintenance-free sealed X-ray source Fast scans for QC, or 4D XRM |
| X-ray detector |
CCD detector 11 MP (4032 x 2688) 16 MP (4904 x 3280) |
Fine-pitched detectors for achieving highest resolution |
| Object size |
75 mm diameter 70 mm height |
Capable to scan from small to medium large sample sizes |
Rigaku Miniflex600 XRD
This 6th generation tabletop X-ray diffractometer has a 600 W source and D/teX Ultra 1D silicon strip detector, allowing for fast, accurate data collection. Collection and analysis are conducted using the SmartLab Studio-II software, which can be accessed on personal computers by users after checking out one of our network licenses.
Find additional information regarding specs here.
Phenom XL G2 SEM
The Phenom XL G2 desktop SEM features the largest sample stage of any desktop SEM and delivers intuitive, automated solutions that eliminate manual repetitive tasks. It is also particularly known for its desktop-sized design, ease of use, and rapid imaging capabilities and high-resolution imaging of samples.
The innovative design of the Phenom XL provides a list of advantages-
- Fastest vent/load cycle for high throughput
- Only 45 seconds from sample load to SEM imaging
- Color optical camera for single-click navigation.
- Fully integrated elemental analysis with EDS detector option
- Secondary electron detector option
Find additional information regarding specs here.
Bruker Contour GT-I Profilometer
The Bruker Contour GT-I optical profilometer measures surface topography in a non-contact, non-destructive way. Ideal samples for the Contour GT-I have nm to a few mm of topography change, and do not require a large area to be scanned. Vertical resolution can be as low as <0.01 nm for mirror-finish samples, and around 10 nm for rougher samples. Lateral resolution is 0.38 um.
Stage max weight is 10 kg, and max sample height is 100 mm. The sample does not tilt, only the objective head does, allowing for stable samples and no affixing necessary. Auxiliary lighting is also available for improved measurements.
Keyence VR-3200 Optical Profilometer
The Keyence VR-3200 optical profilometer measures surface topography in a non-contact, non-destructive way. This tool is very straightforward to use, with a user-friendly interface. Ideal samples for the VR-3200 are larger than a few mm (field of view ranges from 1.9 - 24 mm), and can have several mm of height change (measurable height range is 1 - 10 mm).
The VR-3200 has an automatic stage (weight limit of 28 kg) that enables large stitched images at high resolution and also automatically finds the interference fringes, saving time. White LED is the only illumination option, which is part of the reason for a limited resolution.
If you need a higher resolution for your profilometry, please refer to our Bruker Contour GT-I page.
Hysitron TI900 Triboindenter
The Nano-mechanical test system is a Hysitron TI900 Triboindenter which allows nano-Newton level resolution depth-resolved measurements of hardness and elastic modulus both normal (hardness) and lateral (friction) force loading configurations are available to provide a sub-micron scale testing arena with real-time data collection and nanometer resolution in-situ SPM imaging.
Netzsch Laser Flash Analyzer 427
The Laser Flash Analyzer (LFA) can measure thermal diffusivity from room temperature up to 2000°C. Some of its key features include high accuracy rapid testing time and a user-friendly interface. Thermal diffusivity range- 0.01 mm2/s to 1000 mm2/s.
Netzsch Themomechanical Analyzer 402 F1
Thermomechnical Analyzer (TMA) can measure the thermal expansion of a substance under a force (2000mN) as a function of temperature range (room temperature to 1550°C) and time. TMA is closely related to dilatometry, which determines the length change of samples under negligible load.
The measurement system is thermally stabilized via water cooling and all connections have a vacuum-tight design.
