Request FOM access
- New users must go to FOM (Facility Online Manager) and complete the "I am a New User" form, please do not include any spaces in your username.
- If you would like to learn more about the use and functions of FOM, please review the User Manual provided.
- The MMCL capabilities can be accessed by use-request via the web-based system FOM at https://fom.nano.pitt.edu/fom/welcome.
Bruker Contour GT-I Profilometer
The Bruker Contour GT-I optical profilometer measures surface topography in a non-contact, non-destructive way. Ideal samples for the Contour GT-I have nm to a few mm of topography change, and do not require a large area to be scanned. Vertical resolution can be as low as <0.01 nm for mirror-finish samples, and around 10 nm for rougher samples. Lateral resolution is 0.38 um.
Stage max weight is 10 kg, and max sample height is 100 mm. The sample does not tilt, only the objective head does, allowing for stable samples and no affixing necessary. Auxiliary lighting is also available for improved measurements.
Bruker Skyscan 1272 Micro-CT
The Bruker Skyscan 1272 employs micro-computed tomography to visualize a 3D object. X-rays are used to form a shadow projection at multiple angular steps, and algorithms are used to reconstruct the object based on the X-ray attenuation in each projection.
Included with the instrument is the 3D.SUITE software, enabling all steps of the analysis process: reconstruction (NRecon), 2D/3D morphological analysis (CTAn), and 3D visualization (CTVox). A second computer is also available for dedicated analysis, to streamline workflow.
Specifications, from the Bruker page on the SkyScan 1272:
| Feature | Specification | Benefit |
| X-ray source | 20 – 100 kV 10 W < 5 µm spot size at 4 W |
Maintenance-free sealed X-ray source Fast scans for QC, or 4D XRM |
| X-ray detector | CCD detector 11 MP (4032 x 2688) 16 MP (4904 x 3280) |
Fine-pitched detectors for achieving highest resolution |
| Object size | 75 mm diameter 70 mm height |
Capable to scan from small to medium large sample sizes |
Hysitron TI900 Triboindenter
The Nano-mechanical test system is a Hysitron TI900 Triboindenter which allows nano-Newton level resolution depth-resolved measurements of hardness and elastic modulus both normal (hardness) and lateral (friction) force loading configurations are available to provide a sub-micron scale testing arena with real-time data collection and nanometer resolution in-situ SPM imaging.
Keyence VHX 970 Optical Microscope
The Keyence VHX 970 DOM features a wide range of magnification options at high resolution and short working distance, making it ideal for polished metal samples, or high-mag evaluation without an SEM. Additional lighting and adapter options makes for a flexible and easily customizable imaging experience.
Keyence VR-3200 Optical Profilometer
The Keyence VR-3200 optical profilometer measures surface topography in a non-contact, non-destructive way. This tool is very straightforward to use, with a user-friendly interface. Ideal samples for the VR-3200 are larger than a few mm (field of view ranges from 1.9 - 24 mm), and can have several mm of height change (measurable height range is 1 - 10 mm).
The VR-3200 has an automatic stage (weight limit of 28 kg) that enables large stitched images at high resolution and also automatically finds the interference fringes, saving time. White LED is the only illumination option, which is part of the reason for a limited resolution.
If you need a higher resolution for your profilometry, please refer to our Bruker Contour GT-I page.
Zeiss Smartzoom 5 Optical Microscope
The Zeiss Smartzoom 5 digital optical microscope is highly automated and makes imaging simple and repeatable. Two available lenses span the approximate magnification range of 10-1000x.
The Smartzoom microscope is ideal for microscope novices, large samples, high throughput of similar imaging protocols, 3D mapping using focus detection, and objects that require a high depth of field.
MultiPrep 8 Automated Precision Sample Preparation System
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. Capabilities include parallel polishing, angle polishing, site-specific polishing or any combinations.
PELCO Wire Saw
With the PELCO Wire Saw, samples can be cut precisely, quickly, and without a heat-affected zone. A diamond-impregnated or plain wire can be used, with either water or an abrasive slurry.
Typical setup is 0.10 in. stainless steel wire with BN based slurries, but this can be modified if requested.
TechCut 4 Low Speed Saw
The TechCut 4™ is a precision low speed saw excellent for cutting smaller, delicate samples that cannot tolerate increased heat caused by high speed sectioning. The pivoting cutting arm has adjustable weights to apply or counterbalance downward force to the sample during sectioning. Cutting fluid is drawn from the reservoir by the blade to cool the sample. With a 3" to 6" blade range, samples up to 2" thick can be sectioned.
