5th floor Benedum Hall, suite 532 BEH
MMCL provides kernel of scientific expertise and modern instrumentation for electron-, ion- and X-ray beam analysis of materials. Researchers, students, faculty and staff are offered access to expertise of personnel, experimental tools and advanced techniques for complete materials micro-characterization. This encompasses visualization of the surface and internal structure, analysis of composition, measurements of surface metrics and micro-/nano-mechanical properties of materials that bridges the length scales from the microscopic to near-atomic level.
Equipment usage and scheduling is available via the FOM system: