Pitt | Swanson Engineering
Facility


• Ellipsometer
facility1a 
Alpha-SE ellipsometer for measurements of thickness and optical property of nanometer-thick films.


• Contact angle tester w/ environmental chamber and tilting capability

 WCA
VCA Optima contact angle tester with temperature/humidity control and tilting capability to investigate the liquid/solid interface.       


• Dip Coater
facility3 
KSV Dip Coater for precise fabrication of sub-nanometer films.

• UV-Ozone Procleaner
facility4 
UV/Ozone ProCleaner for surface modification and treatment.


• Thermo Gravimetric Analyzer (TGA)
facility5 
TG/DTA 220 for studying the thermal stability of various materials

• Tribometer
facility6 
CSM Instruments Nano Tribometer 2 (NTR2) for the tribology characterization of various materials. This advanced tribometer allows for detection of low and high frictional forces with superior precision and accuracy.

• Optical Microscope
facility7 
Carl Zeiss AxioScope